fluorescence spectrum
Microscopic defects film thickness
Solar Cell IV
Semiconductor Material Testing
Andor Spectrometer
fiber optic spectrometer
Laser spectral analysis
single-point detector
imaging camera
Electrical Test Instruments
EDMUND Optics
Newport Products
Crystal Optical Products
Product Specification
| suffix number | Spectral Response (nm) | Optical cathode materials | photocathode ray window material | |
| realm | peak wavelength | |||
| 50 | 160 to 850 | 430 | polyalkali | Synthetic silicon dioxide |
| 51 | 160 to 910 | 600 | Extended red polybasic | Synthetic silicon dioxide |
| 52 | 160 to 650 | 400 | alkali | Synthetic silicon dioxide |
| 53 | 160 to 320 | 230 to 250 | Cesium-tellurium | Synthetic silicon dioxide |
English