fluorescence spectrum
Microscopic defects film thickness
Solar Cell IV
Semiconductor Material Testing
Andor Spectrometer
fiber optic spectrometer
Laser spectral analysis
single-point detector
imaging camera
Electrical Test Instruments
EDMUND Optics
Newport Products
Crystal Optical Products
Main technical indicators
| Micro-area spectral detection range | 400-1500nm |
| detection mode | Transmission/Reflection/Microzone/Imaging |
| Highest spatial resolution | 500nm |
| Maximum time resolution | 1.5 times laser pulse width |
| time window | 8ns |
| Imaging band range | 400-800nm |
| Imaging pixels | 640×480 |
| signal-to-noise ratio before zero | ≤0.2mOD |
| Device Expandability | Expandable conventional sample chamber for transient absorption spectroscopy from 380-1650nm Can be coupled to cryostats, probe stations, electrical regulators and external magnets |
| Application Example 1 - Microzone Transmission Testing | |||
| experimental condition | |||
| Excitation wavelength | 515nm | Scan Delay Time Points | 159 |
| Objective magnification | 50X | Number of scans | 3 times |
| Points per point time | 1.2s | Total test time | 9min45s |
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| Application Example 2 - Microzone Reflection Testing | |||
| experimental condition | |||
| Excitation wavelength | 515nm | Scan Delay Time Points | 59 |
| Objective magnification | 50X | Number of scans | 3 times |
| Points per point time | 1.2s | Total test time | 9min45s |
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| Application Example 3 - Wide Field TA Imaging | |||
| experimental condition | |||
| Excitation wavelength | 515nm | Acquisition frequency | 1K Hz |
| Detecting optical wavelengths | 660nm | Single photo credit time | 1s |
| Sample name | Single-layer WS2 (substrate: sapphire) | Scanning Points | 159 |
| Objective magnification | 50X | Number of scans | 5 times |
| Detection Size | 30X45 micron | Total test time | 16min |
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| Application Example 4-Carrier Diffusion Imaging | |||
| experimental condition | |||
| Excitation wavelength | 400nm | Single photo credit time | 6 s |
| Detecting optical wavelengths | 650nm | Scanning Points | 109 |
| Sample name | Bi202Se single crystal | Number of scans | 1 time |
| Objective magnification | 50X | Total test time | 11min |
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