PSM-4K Series Closed Circuit Cryogenic Probe Station

Product Overview

The 4K closed-cycle cryogenic probe station plays a vital role in scientific research and technology development. It is capable of performing various non-destructive physical and electrical property tests on samples in a low-temperature environment, which helps researchers gain an in-depth understanding of the physical and electrical properties of materials or devices, thus providing important data support for the development and application of new materials.

The PSM-4K series cryogenic probe station is a high performance closed-cycle cryogenic probe station with a compact and low vibration design that provides a <5K-350K high and low temperature vacuum test environment for electrical parameter testing of semiconductor chips. It utilizes closed-cycle refrigeration, eliminating the need for liquid helium, and has a temperature of 4.5K.

specificities
- 4.5 K using closed-cycle refrigeration without liquid helium consumption.
- Displacement adjustment of the probe arm is operated outside the vacuum chamber, allowing different devices on the sample to be switched for testing without destroying the vacuum.
- Unique probe arm X-Y-Z-R four-dimensional adjustment to accommodate testing of 4-inch samples.
- The vacuum cavity is made of aluminum, which can effectively reduce the external electromagnetic interference and improve the accuracy and stability of the test.
- The probe arm adopts tri-coaxial connector with good leakage performance, measured leakage current is less than 100fA @ 1V@4.5K-350K.
- Wide test temperature range, support 4.5K-350K continuous temperature change.
- Uniquely designed flexible probe, the probe is mounted on a copper elastomer, avoiding excessive force during lancing to cause damage to the sample or electrode.

Technical Parameters

Parameters and indicators: