Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe

The Keysight B1500A Semiconductor Device Parameter Analyzer is a comprehensive device characterization solution with a rich set of measurement capabilities such as IV, CV, and Fast Pulse IV for high measurement reliability.

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    Accelerates basic current-voltage (IV) and capacitance-voltage (CV) measurements and industry-leading ultra-fast IV device characterization
    Comprehensive solutions for all your device characterization needs:

    The B1500A semiconductor device analyzer combines a wide range of measurement and analysis functions into a single instrument for accurate and fast device characterization. It is the only multifunctional parameter analyzer available today that offers a broad range of device characterization functions with the best measurement reliability and repeatability. It performs a full range of measurements from basic current-voltage (IV) and capacitance-voltage (CV) characterization to fast, accurate pulse IV testing. In addition, the B1500A's 10-slot modular architecture allows you to add or upgrade measurement modules to meet changing measurement needs.

    Keysight EasyEXPERT group+ software is the B1500A's own GUI interface software that runs on the B1500A's embedded Windows 10 platform and supports efficient and repeatable device characterization.With hundreds of ready-to-use measurements (application tests), the B1500A provides an intuitive and powerful operating environment for test execution and analysis. B1500A provides an intuitive and powerful operating environment for test execution and analysis. It enables engineers to accurately and quickly electronically characterize and test devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device.
    Key Features dominance
    Precision voltage and current measurement

    (0.5 µV and 0.1 fA resolution)

    		 - Accurate characterization of low voltages and small currents.
    For multi-frequency (1 kHz to 5 MHz) capacitance measurements

    （Highly accurate and low-cost solution for switching between CV, C-f and C-t and current/voltage (IV) measurements.

    		 - Switch between CV and IV measurements without reconnecting cables - maintains excellent small current measurement resolution

    (1 fA minimum with SCUU, 0.1 fA minimum with ASU)

    - Provides a complete CV compensation output for the device under test
    Ultra-fast IV measurements.

    100 ns pulse and 5 ns sampling rate

    		 - Capture ultra-fast transients that cannot be accurately measured by conventional test instruments
    Over 300 applications tested for instant availability - Reduction in the time required to learn to use an instrument, make measurements and become proficient in its operation
    Curve Tracer Mode with Oscilloscope View - Interactively develop tests and instantly view device characteristics

    - Verification of current and voltage pulses without the use of any other equipment (MCSMU provides an oscilloscope view)
    Powerful data analysis and reliable data management - Automatic analysis of measurement data without the use of an external PC

    - Automatic storage of measurement data and test conditions, quick recall of this information at a later date

     

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