fluorescence spectrum
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Semiconductor Material Testing
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single-point detector
imaging camera
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Capability.
- Multiple Schottky structures available
- Specially designed Schottky contacts to minimize series resistance.
- Precise vacuum control
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Mercury probe testing
LEI Model2017B, which tests the carrier concentration distribution of various semiconductor materials by the mercury probe contact method, is particularly suitable for compound materials such as GaN.SiC.
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