Deep Energy Level Transient Spectrum Tester

Deep Level Transient Spectroscopy (DLTS) is the best technical means to detect defects and impurities in semiconductor materials and devices, which can determine various deep level related parameters, such as deep energy levels, capture interfaces, concentration distributions and so on.

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Capability.

High sensitivity
C-V characterization Deep energy level C-V testing
Capture cross section measurement Capture interface test
Optical injection
Conductance transient measurements Transient conductance measurements
Sample quality test by I-V, C-V I-V/C-V basic test
Cryostats LN2, low temperature cryogenic

Deep Energy Level Transient Spectrum Tester

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Capability.

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